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IEEE P2668 IoT Maturity Index Standard Discussion Forum 2019
 


Date, time & venue

2019-08-26;6:30pm Refreshment: 7pm to 8:30pm;Rm PQ306, Polytechnic University of Hong Kong

 

IEEE P2668 IoT Maturity Index Standard Discussion Forum 2019

 

 

Date: 26 August 2019 (Monday)

Time: 6:30pm Refreshment: 7pm to 8:30pm

Venue: Rm PQ306, Polytechnic University of Hong Kong

Fees: Free of charge

Language: English

Organized by: Chinese Institute of Electronics Hong Kong

Supported by: HKIE Electronics Division

Enquiry: Ir Dr. KF Tsang (Email: ee330015@cityu.edu.hk, ee40362011@gmail.com)

 

Description:

 

Internet of Things (IoT) has become the essential building block of smart city. The robust establishment of IoT provides the basic channel for data collection and aggregation. The supplement and manifestation of artificial intelligence, edge computing, big data, anti cyber attack measures… etc will inevitably bombard fruitful applications and usages. In essence, there will be tons of IoT connections in the near future and massive IoT connections will be established.  As such, ways to measure IoT performance will be crucial to the development of IoT solution.  Unfortunately, not much attention has been drawn to the fact that there is NO universal standard on smart sensors. This seminar will address this issue and discuss the use and adoption of IEEE P2668 and IEEE P1451 to help to evaluate and thus improve the development of IoT solutions.  Use cases will be discussed.

 

Moderators: Dr. YH Shum and Dr. KF Tsang

Panelists: Dr. Stefan Mozar (FIEEE), Dr. Victor Huang, Peter Waher and Dr. Tony Lee

 





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