IEEE P2668 IoT Maturity
Index Standard Discussion Forum 2019
Date: 26 August 2019 (Monday)
Time: 6:30pm Refreshment: 7pm to 8:30pm
Venue: Rm PQ306, Polytechnic University of Hong Kong
Fees: Free of charge
Language: English
Organized by: Chinese Institute of
Electronics Hong Kong
Supported by: HKIE Electronics Division
Enquiry: Ir Dr. KF Tsang (Email: ee330015@cityu.edu.hk, ee40362011@gmail.com)
Description:
Internet of Things (IoT) has become the essential building block of
smart city. The robust establishment of IoT provides the basic channel for data
collection and aggregation. The supplement and manifestation of artificial
intelligence, edge computing, big data, anti cyber attack measures… etc will
inevitably bombard fruitful applications and usages. In essence, there will be
tons of IoT connections in the near future and massive IoT connections will be
established. As such, ways to measure
IoT performance will be crucial to the development of IoT solution. Unfortunately, not much attention has been
drawn to the fact that there is NO universal standard on smart sensors. This
seminar will address this issue and discuss the use and adoption of IEEE P2668
and IEEE P1451 to help to evaluate and thus improve the development of IoT
solutions. Use cases will be discussed.
Moderators: Dr. YH Shum and Dr. KF Tsang
Panelists: Dr. Stefan Mozar (FIEEE), Dr.
Victor Huang, Peter Waher and Dr. Tony Lee